Parallel NAND Flash
Comprehensive test, including 80 sub-items in 50 major items, and actual defect parts per million (DPPM) of less than 100
Product Advantages
The product has undergone a comprehensive test including 80 sub-items in 50 major items, and the actual DPPM is less than 100.
As one of our main products, it features a 1xnm process, build-in 4-bit ECC verification, and high density, thus suitable for big data storage.
It also supports OTP, allowing more room for customers to securely store information.
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